X-Ray Metrology in Semiconductor Manufacturing

X-Ray Metrology in Semiconductor Manufacturing voorzijde
X-Ray Metrology in Semiconductor Manufacturing achterzijde
  • X-Ray Metrology in Semiconductor Manufacturing voorkant
  • X-Ray Metrology in Semiconductor Manufacturing achterkant

Emphasizes on practical metrology, with real world examples from the semiconductor and magnetics industries. This book discusses the techniques, theory, and applications of X-ray metrology in semiconductors and other advanced thin films. It covers the essential metrological questions of precision and repeatability, absolute accuracy and spot size.

Specificaties
ISBN/EAN 9780849339288
Auteur D. Keith (Bede Plc Bowen
Uitgever Van Ditmar Boekenimport B.V.
Taal Engels
Uitvoering Gebonden in harde band
Pagina's 296
Lengte
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