X-Ray Metrology in Semiconductor Manufacturing
Emphasizes on practical metrology, with real world examples from the semiconductor and magnetics industries. This book discusses the techniques, theory, and applications of X-ray metrology in semiconductors and other advanced thin films. It covers the essential metrological questions of precision and repeatability, absolute accuracy and spot size.
Specificaties
| ISBN/EAN | 9780849339288 |
| Auteur | D. Keith (Bede Plc Bowen |
| Uitgever | Van Ditmar Boekenimport B.V. |
| Taal | Engels |
| Uitvoering | Gebonden in harde band |
| Pagina's | 296 |
| Lengte | |
| Breedte |
