Elements of Electromigration
Electromigration in 3D IC technology
In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.
Specificaties
| ISBN/EAN | 9781032470283 |
| Auteur | King-Ning (City University of Hong Kong) Tu |
| Uitgever | Van Ditmar Boekenimport B.V. |
| Taal | Engels |
| Uitvoering | Paperback / gebrocheerd |
| Pagina's | 132 |
| Lengte | |
| Breedte |